SC Logo
IEEE Logo
Logo
IEEE Logo

Some of the recommended similar articles:

 

Analysis of nanoparticle growth in environmental transmission electron microscopy

2016 New York Scientific Data Summit (NYSDS)

 

Structure analysis of nanoparticle catalysts by environmental transmission electron microscopy

2011 International Meeting for Future of Electron Devices

 

Characterization of Low-Temperature Stress-Induced Crystallization of a-Si on Flexible Glass Substrates by Transmission Electron Microscopy and Raman Spectroscopy

2005 International Conference on Microelectronics

 

High resolution analysis of intermetallic compounds in microelectronic interconnects using Electron Backscatter Diffraction and Transmission Electron Microscopy

2010 Proceedings 60th Electronic Components and Technology Conference (ECTC)

 

Nano-scale defect investigation by site-specific transmission electron microscopy and electron energy loss spectroscopy

2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)

 

Dextran-coated magnetite nanoparticles effects in mice: a transmission electron microscopy investigation

2005 IEEE International Magnetics Conference (INTERMAG)

 

Reliability characterization of MOVPE grown n-GaInP/p-GaAs heterojunctions vis-a-vis high temperature operation through photoreflectance spectroscopy, transmission electron microsc...

JEDEC (formerly the GaAs REL Workshop) ROCS Workshop, 2004.

 

Investigation on microstructure-magnetic property relationship of nanocrystalline Fe-Zr-B-Ag magnetic films using high resolution transmission electron microscopy and X-ray diffrac...

2002 IEEE International Magnetics Conference (INTERMAG)

 

The Nanoaquarium: A Platform for In Situ Transmission Electron Microscopy in Liquid Media

Journal of Microelectromechanical Systems

 

Practical and Reproducible Mapping of Strains in Si Devices Using Geometric Phase Analysis of Annular Dark-Field Images From Scanning Transmission Electron Microscopy

IEEE Electron Device Letters

 

A non-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
Copyright 2023 IEEE – All rights reserved. Use of this website signifies your agreement to the IEEE Terms and Conditions
This site is also available on your smartphone.